Structural and Crystalline Properties Analysis of Nanomaterials Using Electron Diffraction Techniques

In this research, we present a fast and easy method for analyzing electron diffraction patterns of randomly selected areas (SAED) without the need to rotate or tilt the sample. The goal is to determine the crystalline phase and unit cell by combining the outcomes with software for X-ray diffraction (XRD). After determining the pattern's center, the two-dimensional (2D-SAED) pattern can be easily transformed into a one-dimensional (1D-profile) file if the Transmission Electron Microscope (TEM) is calibrated correctly and the camera length is accuratelyadjusted. After precisely detecting the peaks or matching the file, this file is then input into XRD analysis tools, allowing phase identification and unit cell determination. The method was tested and validated using two nanomaterials: TiO₂ with a flaky structure and TiO₂ nanotubes deposited with silver nanoparticles. The method also demonstrated success in crystalline analysis of a single gold nanoparticle crystal, indicating its potential use in analyzing small-sized nanocrystals, although it may require using two or more tilted SAED patterns. If dependable integrated diffraction intensity can be derived, this method can be extended for quantitative phase analysis, structural determination, and enhancing Rietveld refinement models for nanomaterials.